1 Mrad Rad Hard Transistors added to MIL-PRF-19500 QPL
Semicoa has been granted Level H (1 Mrad) Radiation Hardness Assurance (RHA) level for its 2N2221A, 2N2222A, 2N2369A, 2N2906A, 2N2907A, 2N3227, and 2N4449 bipolar transistors. This qualification was based on High Dose Rate Total Dose qualification testing in accordance with MIL-STD-750, Test Method 1019. Devices are available in die form at JANHC plus RHA or JANKC plus RHA letter designator or package form at the JANTXV plus RHA or JANS plus RHA letter. These part numbers are qualified to High Dose Rate Total Dose at a dose rate between 50 and 300 rad/s, with the parts tested in the biased state during exposure. A sample of 11 devices are tested from each wafer to qualify them for this RHA letter designator. Acceptance of a wafer or wafer lot is based on all samples meeting the Group D, subgroup 2 parameter limits and all parameter deltas (Group D minus Group A) meeting their respective limits using statistics at the 0.99/90% level. This high level of radiation hardness is critical for strategic program applications, where radiation survivability is the key selection criteria for program usage.